Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

图书介绍

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

By: Manoj Sachdev José Pineda de Gyvez
ISBN-10: 0387465464    ISBN-13: 9780387465463
Publisher: Springer - 2007-06-21
Hardcover | 2nd ed. Edition | 328 Pages

Editorial Review:

Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thickness and interconnect dimensions goes well beyond acceptable limits, new test methodologies and a deeper insight into the physics of defect-fault mappings are needed. In Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits state of the art of defect-oriented testing is presented from both a theoretical approach as well as from a practical point of view. Step-by-step handling of defect modeling, defect-oriented testing, yield modeling and its usage in common economics practices enables deeper understanding of concepts.

The progression developed in this book is essential to understand new test methodologies, algorithms and industrial practices. Without the insight into the physics of nano-metric technologies, it would be hard to develop system-level test strategies that yield a high IC fault coverage. Obviously, the work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work.

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1. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
2. Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing)
3. Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
4. Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
5. Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circui
6. Fault-Tolerance Techniques for SRAM-Based FPGAs (Frontiers in Electronic Testing)
7. [request_ebook] CMOS VLSI Design : A Circuits and Systems Perspective, 3rd Ed.
8. Principles of CMOS VLSI Design, 1st Edition, 1985 (VLSI systems series)
9. Principles of CMOS VLSI Design, 1st Edition, 1985 (VLSI systems series)
10. Effective Software Testing: 50 Specific Ways to Improve Your Testing by Elfriede Dustin

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